Design for AT-Speed Test, Diagnosis and Measurement (FRONTIERS IN ELECTRONIC TESTING Volume 15) Review

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(More customer reviews)With recent advances in semi conductor process technology companies that design and manufacture leading edge products are quickly moving towards deep sub micron (DSM) integrated circuits (IC) technology. This transition occurs because DSM technology enables increased functionality, higher chip performance and decreased costs.
One obstacle to achieving the full benefits of a DSM technology is the inability of today's design and test methodologies to keep up with continual advances in semi conductor process development. As more companies experience the testing challenges imposed b DSM technology, there is a growing acceptance that semi conductor designers and manufacturers must use a hierarchal approach to testing. Leading manufacturers/developers of semi conductor products are adopting hierarchal test solution - embedded test. Embedded test extends conventional test method with a test solution that hierarchally embeds critical portion of the ATE into the product itself. This embedded test critical portions of the ATE into the product itself. This embedded test complements the functionality of the external ATE and addresses the complexity of products based on technology.
This text provides the application of one such vendor -Logic Vision. If the reader is in search of in-depth embedded test application knowledge in DFT, MBIST, LBIST and JTAG then this is not a recommended book, as this is a handy reference manual to Logic Vision tools.

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Design for AT-Speed Test, Diagnosis and Measurement isthe first book to offer practical and proven design-for-testability(DFT) solutions to chip and system design engineers, test engineersand product managers at the silicon level as well as at the board andsystems levels. Designers will see how the implementation of embeddedtest enables simplification of silicon debug and system bring-up. Testengineers will determine how embedded test provides a superior levelof at-speed test, diagnosis and measurement without exceeding thecapabilities of their equipment. Product managers will learn how thetime, resources and costs associated with test development,manufacture cost and lifecycle maintenance of their products can besignificantly reduced by designing embedded test in the product. Acomplete design flow and analysis of the impact of embedded test on adesign makes this book a `must read' before any DFT is attempted.

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