Production Testing of RF and System-on-a-Chip Devices for Wireless Communications (Artech House Microwave Library) Review

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(More customer reviews)Production Testing of RF and System-on-a-Chip Devices for Wireless Communications (Artech House Microwave Library)
The author blows right by the topic of RF measurement system calibration and the analysis of measurement uncertainty. RF measurement system calibration techniques, is an essential topic if the Test Engineer is to be successful. Without this knowledge, the Test Engineer will become frustrated and deplete his/her resources when the time comes to correlate the test system measurements.
In addition; while performing a cursory review, I came across a misconception relating to S-Parameters. On pages 16 and 17, the author references a non-linear device (mixer) to explain the concept of S-Parameters. S-Parameters, by definition, are linear parameters; however, the author states the mixer's conversion loss, a non-linear parameter, is also S21. He is correct with respect to a 3-port device having nine (9) S-Parameters, however, S21 of the mixer is the IF isolation (rejection) with respect to the RF port and IF port respectfully. This statement is a complete misconception. S-Parameters is a fundamental concept, providing a solid base to RF and microwave engineering. It is apparent; the author does not understand the subject matter. To the neophyte, he looks like an authority. To the wiser, he is a snake-oil salesman and should not be allowed to publish fiction as a reference book. If you cannot run with the big dogs, then sit on the porch.

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With the increasing number of integrated wireless devices being developed with SOC (system on a chip) technology, a merger of RF and mixed-signal test approaches is quickly becoming a necessity. Addressing this need head-on, this first-of-its-kind resource offers you an in-depth overview of RF and SOC product testing for wireless communications. The book introduces new, creative methods that lead to more efficient testing, such as multi-site and parallel testing. You learn how to determine critical measurements for specific applications, including Bluetooth, WLAN, and 3G devices. Moreover, the book shows you how to perform these measurements cost effectively in a production test environment.

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