
Average Reviews:

(More customer reviews)With the complexities of the designs continually increasing; it is imperative to ensure the device is tested thoroughly; and hence the failing parts are screened out during production testing. To this purpose `design for testability'; the book gives an elementary overview. The book uses a very practical approach to the topic of design for test; the concepts are emphasize and explained by some meaningful examples.
The format of the book is well organized; the book is partitioned, where each chapter covers a topic in the test area. The information in each chapter is fairly basic and is easy to comprehend; since it does not get too theoretical. I would recommend this book to a beginner.
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A pragmatic approach to testing electronic systemsAs we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base.Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is appliedto random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include:* An explanation of where a test belongs in the design flow* Detailed discussion of scan-path and ordering of scan-chains* BIST solutions for embedded logic and memory blocks* Test methodologies for FPGAs* A chapter on testing system on a chip* Numerous references
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