12/22/2011

Design-For-Test For Digital IC's and Embedded Core Systems Review

Design-For-Test For Digital IC's and Embedded Core Systems
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While looking for a digital testing textbook that was more accessible to students than the Abramovici "Digital Systems Testing and Testable Design" text, I came across this one and thought it would be the perfect answer. When my copy arrived I was sorely disappointed.
If you need a book to introduce you to what the various testing techniques are, this book does a wonderful job! Its discussion will surely be useful to the typical test engineer. However, if you want to really understand HOW the design techniques work and how to optimize them, this book truly lives up to its claim of "Skip the high-brow theories and mathematical formulas" --- you will receive very little help in your endeavor.
This book's usefulness depends on what your need is. In one case it is great; in another it is poor.

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The purpose of this book is to introduce the basic concepts of test and design-for-test (DFT), and to then address the application of these concepts with an eye toward the trade-offs of the engineering budgets (area, frequency, power, etc.), the business drivers, and the cost drivers. This practical guide on the test and Design-for-test topics has been developed along the lines of a just what you need to know and how to do it guide that explains the topic, the trade-offs, and relates the topic to the design flow.

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