Average Reviews:
(More customer reviews)This book is the ultimate reference on testing for VLSI circuits. It is a must have if your interest is in delay testing. It is truly superbly written.
Click Here to see more reviews about: Delay Fault Testing for VLSI Circuits (Frontiers in Electronic Testing)
With the ever-increasing speed of integrated circuits,violations of the performance specifications are becoming a majorfactor affecting the product quality level. The need for testingtiming defects is further expected to grow with the current designtrend of moving towards deep submicron devices. After a long period ofprevailing belief that high stuck-at fault coverage is sufficient toguarantee high quality of shipped products, the industry is now forcedto rethink other types of testing. Delay testing has been a topic of extensive research both in industryand in academia for more than a decade. As a result, several delayfault models and numerous testing methodologies have been proposed.Delay Fault Testing for VLSI Circuits presents a selection ofexisting delay testing research results. It combines introductorymaterial with state-of-the-art techniques that address some of thecurrent problems in delay testing. Delay Fault Testing for VLSI Circuits covers some basic topicssuch as fault modeling and test application schemes for detectingdelay defects. It also presents summaries and conclusions of severalrecent case studies and experiments related to delay testing. Aselection of delay testing issues and test techniques such as delayfault simulation, test generation, design for testability andsynthesis for testability are also covered. Delay Fault Testing for VLSI Circuits is intended for use by CADand test engineers, researchers, tool developers and graduatestudents. It requires a basic background in digital testing. The bookcan used as supplementary material for a graduate-level course on VLSItesting.
Buy cheap Delay Fault Testing for VLSI Circuits (Frontiers in Electronic Testing) now.
No comments:
Post a Comment